In this project, the general features of the physicochemical behavior of thin films of the layered perovskite YBaCo2O5.50+δ are carefully studied. In so doing, YBaCo2O5.50+δ polycrystalline is synthesized either by polymeric precursor method or standard solid-state reaction. The polycrystalline samples are carefully characterized according their structural, morphological, electrical, and magnetic properties using standard characterization techniques such as X-ray diffraction (XRD), scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDS), SQUID magnetometry and transport measurements. The achieved results allow one to determine which of the routes is more suitable for obtaining the target composition, i.e., the compound with the less concentration of foreign phases. This information is then used, to fabricate targets of the compound by pressing the powders and subsequent sinterization at high temperatures. The target is mounted on a cathode of a magnetron sputtering system from which thin films of the cobaltite are deposited on (001)-oriented SrTiO3 substrates. The substrate temperature is varied between 700 and 850 C in order to optimize this important growing parameter. Similar to the polycrystalline material, the films are characterized according their structural, morphological, electrical, electronic, optical and magnetic properties using standard analytical techniques as mentioned above. The analysis of the experimental results should allow one to get insight into the intrinsic behavior of the complex YBaCo2O5.50+δ cobaltite in thin film form.