Proyectos
XPS analysis and structural and morphological characterization of Cu2ZnSnS4 thin films grown by sequential evaporation
Resumen
This work describes a procedure to grow single phase Cu2ZnSnS4 (CZTS) thin films with tetragonal-kesterite type structure, through sequential evaporation of the elemental metallic precursors under a flux of sulphur supplied from an effusion cell. X-ray diffraction analysis (XRD) which is mostly used for the phase identification can not clearly distinguish the formation of secondary phases such as Cu2SnS3 (CTS), since both compounds have the same diffraction pattern; therefore the use of a complementary technique is needed. Raman scattering analysis was used to distinguish these phases. The influence of the preparation conditions on the morphology and phases present in CZTS thin films were investigated through measurements of scanning electron microscopy (SEM) and XRD respectively. From transmittance measurements, the energy band gap of the CZTS films was estimated to be around 1.45 eV. The limitation of XRD to identify some of the phases that can remain after the growth process are investigate and the results of Raman analysis of the phases formed in samples grown by this method are presented. Further, the influence of the preparation conditions on the the chemical composition homogeneity in the volume was studied by X-ray photoelectron spectroscopy (XPS) analysis.
Convocatoria
Nombre de la convocatoria:CONVOCATORIA DEL PROGRAMA NACIONAL PARA LA VISIBILIDAD INTERNACIONAL DE LA PRODUCCIÓN ACADÉMICA MEDIANTE EL APOYO PARA TRADUCCIÓN O CORRECCIÓN DE ESTILO DE ARTÍCULOS DE INVESTIGACIÓN 2013-2015
Modalidad:Modalidad 1. Revisión de estilo o traducción de artículos completos escritos por docentes de planta de la Universidad Nacional de Colombia, los cuales vayan a ser sometidos a revistas indexadas en ISI Web Of Knowledge o Scopus del Elsevier.
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